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Fig. 7
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Comparison of the calculated and experimental [109] reflectivity of silicon at 625 nm probe wavelength under 70.5° incidence for the fluence corresponding to 0.72 eV/atom absorbed dose. The data were convolved with 60 fs gaussian probe pulse. Two cases are compared: with electron-ion coupling, and without it (BO approximation). The figure is reproduced from reference [68].